发明名称 PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS
摘要 Provided are photoresist compositions useful in forming photolithographic patterns by a negative tone development process. Also provided are methods of forming photolithographic patterns by a negative tone development process and substrates coated with the photoresist compositions. The compositions, methods and coated substrates find particular applicability in the manufacture of semiconductor devices.
申请公布号 US2012064456(A1) 申请公布日期 2012.03.15
申请号 US201113229672 申请日期 2011.09.10
申请人 BAE YOUNG CHEOL;CARDOLACCIA THOMAS;SUN JIBIN;ARRIOLA DANIEL J.;FRAZIER KEVIN A.;DOW GLOBAL TECHNOLOGIES LLC;ROHM AND HAAS ELECTRONIC MATERIALS LLC 发明人 BAE YOUNG CHEOL;CARDOLACCIA THOMAS;SUN JIBIN;ARRIOLA DANIEL J.;FRAZIER KEVIN A.
分类号 G03F7/20;G03F7/004 主分类号 G03F7/20
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