发明名称 SYSTEMS, METHODS AND APPARATUS USING VIRTUAL APPLIANCES IN A SEMICONDUCTOR TEST ENVIRONMENT
摘要 <p>In one embodiment, a semiconductor test control system includes a computer system having a plurality of hardware resources; a hypervisor installed on the computer system; and a test floor controller installed on the computer system. The hypervisor virtualizes the hardware resources and provides each of at least one virtual appliance with access to a respective virtual set of the hardware resources. Each virtual set of the hardware resources places its respective virtual appliance in controlling communication with at least a first aspect of a semiconductor test system, thereby enabling the respective virtual appliance to test a respective type of semiconductor device. The test floor controller is in controlling communication with i) at least a second aspect of the semiconductor test system, and ii) each of the at least one virtual appliance.</p>
申请公布号 WO2012033484(A1) 申请公布日期 2012.03.15
申请号 WO2010US48013 申请日期 2010.09.07
申请人 VERIGY (SINGAPORE) PTE. LTD.;HILLIGES, KLAUS-DIETER;LIN, JIA-WEI;GURLEY, DUNCAN;JIN, JIMMY, XIAOMIN;VOLKERINK, ERIK, H. 发明人 HILLIGES, KLAUS-DIETER;LIN, JIA-WEI;GURLEY, DUNCAN;JIN, JIMMY, XIAOMIN;VOLKERINK, ERIK, H.
分类号 G06F11/00 主分类号 G06F11/00
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