发明名称 X-RAY DIFFERENTIAL PHASE CONTRAST IMAGING USING A TWO-DIMENSIONAL SOURCE GRATING WITH PINHOLE APERTURES AND TWO-DIMENSIONAL PHASE AND ABSORPTION GRATINGS
摘要 <p>An x-ray differential phase contrast imaging apparatus includes an x-ray source, a source grating, a diffraction grating diffracting x-rays from the x-ray source and source grating and a detector detecting x-rays from the diffraction grating, wherein the source grating includes first x-ray transmissive apertures transmitting x-rays to thereby form a first interference pattern by being diffracted at the diffraction grating, and second x-ray transmissive apertures transmitting x-rays to thereby form a second interference pattern by being diffracted at the diffraction grating, wherein the first and second x-ray transmissive apertures are pinhole apertures which are disposed so that at least part of the first and second interference pattern overlap and the positions of x-ray regions in the first interference pattern differ from the positions of x-ray regions in the second interference pattern, and wherein a combined pattern is formed by the first interference pattern and the second interference pattern.</p>
申请公布号 WO2012032950(A1) 申请公布日期 2012.03.15
申请号 WO2011JP69368 申请日期 2011.08.23
申请人 CANON KABUSHIKI KAISHA;NAGAI, KENTARO 发明人 NAGAI, KENTARO
分类号 G01N23/04 主分类号 G01N23/04
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