发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 In the device, first and second transistors have first and second gates and first and second source/drain regions, respectively. First and second contacts are electrically connected to the first and the second source/drain regions, respectively. A width of a first bottom surface if the first contacts in a gate width direction of the first-gate is wider than a width of the first bottom in a gate length direction of the first-gate. Widths of a second bottom surface of the second-contact are narrower than the longitudinal direction width of the first bottom. The high-concentration region is formed between the first source/drain regions and the first-contact. Extending widths of an outline of the high-concentration region extending from an outline of the first bottom in the longitudinal direction is larger than extending widths of an outline of the high-concentration region extending from an outline thereof in the short direction.
申请公布号 US2012061766(A1) 申请公布日期 2012.03.15
申请号 US201113053611 申请日期 2011.03.22
申请人 IZUMI TATSUO;SUGIMAE KIKUKO;KUTSUKAKE HIROYUKI;YONEHAMA KEISUKE;KABUSHIKI KAISHA TOSHIBA 发明人 IZUMI TATSUO;SUGIMAE KIKUKO;KUTSUKAKE HIROYUKI;YONEHAMA KEISUKE
分类号 H01L27/092;H01L21/336 主分类号 H01L27/092
代理机构 代理人
主权项
地址