| 摘要 |
<p>Disclosed is a test contactor for a semiconductor device for improving heat-radiating efficiency using a thermal conductive material and a manufacturing method thereof. The test contactor for a semiconductor device test according to the present invention includes a contactor (10) which is provided between a terminal (20a) of a semiconductor device (20) and a test circuit board (30) and in which a plurality of through-holes (10b) are formed in the vertical direction to test the electrical performance of the semiconductor device (20), the through-holes (10b) being filled with metallic powders (10a) for relaying electrical signals of the terminal (20a) of the semiconductor device (20). In addition, the method for manufacturing the semiconductor device test contactor according to the present invention includes the steps of: molding the main body using mixed thermally conductive material of silicon and alumina; forming the through-holes in the vertical direction of the main body; and filling the through-holes with the conductive powder.</p> |
