发明名称 INTEGRATED CIRCUIT WITH PROGRAMMABLE LOGIC ANALYZER, ENHANCED ANALYZING AND DEBUGGING CAPABILITIES AND METHOD
摘要 <p>An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.</p>
申请公布号 WO2012033876(A1) 申请公布日期 2012.03.15
申请号 WO2011US50761 申请日期 2011.09.08
申请人 LEXMARK INTERNATIONAL, INC.;BAILEY, JAMES, RAY;CASE, CHRISTOPHER, WILSON;SHARPE, JAMES, PATRICK 发明人 BAILEY, JAMES, RAY;CASE, CHRISTOPHER, WILSON;SHARPE, JAMES, PATRICK
分类号 G01R31/28 主分类号 G01R31/28
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