发明名称 CMP POLISHING LIQUID, METHOD FOR POLISHING SUBSTRATE, AND ELECTRONIC COMPONENT
摘要 The CMP polishing liquid of the invention is used by mixing a first solution and a second solution, the first solution comprises cerium-based abrasive grains, a dispersant and water, the second solution comprises a polyacrylic acid compound, a surfactant, a pH regulator, a phosphoric acid compound and water, the pH of the second solution is 6.5 or higher, and the first solution and second solution are mixed so that the phosphoric acid compound content is within a prescribed range. The CMP polishing liquid of the invention comprises cerium-based abrasive grains, a dispersant, a polyacrylic acid compound, a surfactant, a pH regulator, a phosphoric acid compound and water, with the phosphoric acid compound content being within a prescribed range.
申请公布号 KR20120024810(A) 申请公布日期 2012.03.14
申请号 KR20117030563 申请日期 2010.12.10
申请人 HITACHI CHEMICAL COMPANY, LTD. 发明人 SHINODA TAKASHI;ENOMOTO KAZUHIRO;AKUTSU TOSHIAKI
分类号 H01L21/304;B24B37/00;B24B57/02;C09K3/14 主分类号 H01L21/304
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