发明名称 |
Readout system for MEMs-based capacitive accelerometers and strain sensors, and method for reading |
摘要 |
<p>The invention relates to a method and an electronic readout circuit (50) for measuring a capacitance of a MEMs sensor (90), the readout circuit comprising: an input stage (10) for receiving a first signal (14) from the sensor and for presenting a second signal (17); a charge amplifier stage (20) for amplifying and integrating the second signal; control logic (70) for controlling the readout circuit according to a predefined timing relation synchronized to actuation voltages (51, 52) applied to the sensor for generating the first signal; the readout circuit further comprising: a first switching means (12) for applying a first reference voltage to the sensor; a second switching means (16) for applying the second signal to the charge amplifier stage; the first and the second switching means (12, 16) being controlled according to the predefined timing relation such that a plurality of the second signals are accumulated.</p> |
申请公布号 |
EP2428774(A1) |
申请公布日期 |
2012.03.14 |
申请号 |
EP20100176693 |
申请日期 |
2010.09.14 |
申请人 |
STICHTING IMEC NEDERLAND |
发明人 |
SANTANA, JUAN;VAN LIEMPD, CHRIS;VAN DEN HOVEN, RICHARD |
分类号 |
G01D5/24;G01L9/12;G01P15/125 |
主分类号 |
G01D5/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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