发明名称 Methods for manufacturing a phase-change memory device
摘要 In a method of forming a chalcogenide compound target, a first powder including germanium carbide or germanium is prepared, and a second powder including antimony carbide or antimony is prepared. A third powder including tellurium carbide or tellurium is prepared. A powder mixture is formed by mixing the first to the third powders. After a shaped is formed body by molding the powder mixture. The chalcogenide compound target is obtained by sintering the powder mixture. The chalcogenide compound target may include a chalcogenide compound that contains carbon and metal, or carbon, metal and nitrogen considering contents of carbon, metal and nitrogen, so that a phase-change material layer formed using the chalcogenide compound target may stable phase transition, enhanced crystallized temperature and increased resistance. A phase-change memory device including the phase-change material layer may have reduced set resistance and driving current while improving durability and sensing margin.
申请公布号 US8133429(B2) 申请公布日期 2012.03.13
申请号 US20100762560 申请日期 2010.04.19
申请人 HA YONG-HO;KUH BONG-JIN;KO HAN-BONG;PARK DOO-HWAN;LIM SANG-WOOK;SHIN HEE-JU;SAMSUNG ELECTRONICS CO., LTD. 发明人 HA YONG-HO;KUH BONG-JIN;KO HAN-BONG;PARK DOO-HWAN;LIM SANG-WOOK;SHIN HEE-JU
分类号 B28B1/00;C23C14/06 主分类号 B28B1/00
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