发明名称 Method of manufacturing a bipolar transistor and bipolar transistor obtained therewith
摘要 The invention relates to a method according to the part of the surface of the semiconductor body adjoining the opening and which is to be kept free is provided with a cover layer after which the high-crystalline layer is formed by means of a deposition process. The material of the cover layer can then easily be chosen such that it can be selectively etched relative to the silicon underneath. In addition, the cover layer can easily be selectively deposited on the relevant part of the surface because use can be made of an anisotropic deposition process. In such a process the cover layer is not deposited in the hollow and on the bottom of the hollow. It will be apparent that for the high-crystalline layer also other materials can be chosen such as SiGe having such low Ge contents that the SiGe cannot be etched selectively very well compared to the Silicon.
申请公布号 US8133791(B2) 申请公布日期 2012.03.13
申请号 US20070306653 申请日期 2007.06.12
申请人 HIJZEN ERWIN B.;MEUNIER-BELLARD PHILIPPE;DONKERS JOHANNES J. T. M.;NXP B.V. 发明人 HIJZEN ERWIN B.;MEUNIER-BELLARD PHILIPPE;DONKERS JOHANNES J. T. M.
分类号 H01L21/331 主分类号 H01L21/331
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