发明名称 Epitaxially coated silicon wafer with 110 orientation and method for producing it
摘要 An epitaxially coated silicon wafer comprises a plane surface misoriented relative to a {110} crystal plane, wherein the <110> direction of the single silicon crystal is tilted away by the angle &thetas; from the normal to the wafer surface and the projection of the tilted <110> direction forms an angle &phgr; with the direction <&minus;110> in the wafer, and &thetas; is given by 0&nlE;&thetas;&nlE;3° and 45°&nlE;&phgr;&nlE;90°, as well as for all symmetrically equivalent directions.
申请公布号 US8133318(B2) 申请公布日期 2012.03.13
申请号 US20090454906 申请日期 2009.05.26
申请人 DAUB ERICH;OELKRUG HANS;SCHMELMER OLIVER;SILTRONIC AG 发明人 DAUB ERICH;OELKRUG HANS;SCHMELMER OLIVER
分类号 C30B15/00;C30B21/06;C30B23/00;C30B25/00;C30B27/02;C30B28/12 主分类号 C30B15/00
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