发明名称 |
Epitaxially coated silicon wafer with 110 orientation and method for producing it |
摘要 |
An epitaxially coated silicon wafer comprises a plane surface misoriented relative to a {110} crystal plane, wherein the <110> direction of the single silicon crystal is tilted away by the angle &thetas; from the normal to the wafer surface and the projection of the tilted <110> direction forms an angle &phgr; with the direction <−110> in the wafer, and &thetas; is given by 0≦̸&thetas;≦̸3° and 45°≦̸&phgr;≦̸90°, as well as for all symmetrically equivalent directions. |
申请公布号 |
US8133318(B2) |
申请公布日期 |
2012.03.13 |
申请号 |
US20090454906 |
申请日期 |
2009.05.26 |
申请人 |
DAUB ERICH;OELKRUG HANS;SCHMELMER OLIVER;SILTRONIC AG |
发明人 |
DAUB ERICH;OELKRUG HANS;SCHMELMER OLIVER |
分类号 |
C30B15/00;C30B21/06;C30B23/00;C30B25/00;C30B27/02;C30B28/12 |
主分类号 |
C30B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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