发明名称 CIRCUIT FOR MEASURING INTERVAL OF EVENTS
摘要 PURPOSE: An event time measuring circuit is provided to reduce noise while having a small size, thereby miniaturizing a semiconductor device. CONSTITUTION: An event time measuring circuit comprises a plurality of sub cells(300). The sub cell comprises first inverters(310), second inverters(312), and storing circuits(314). The first inverters are interconnected in series. The second inverters are interconnected in series. The storing circuits are connected to output ends of the first inverters. One or more second inverters are electrically connected to the corresponding first inverter. A first event signal is inputted in one among the first inverters. A second event signal is inputted in one among the second inverters.
申请公布号 KR101123551(B1) 申请公布日期 2012.03.12
申请号 KR20100089900 申请日期 2010.09.14
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 BAEG, SANG HYEON;LEE, SOON YOUNG
分类号 G04F10/04;H03K5/14 主分类号 G04F10/04
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