发明名称 |
CIRCUIT FOR MEASURING INTERVAL OF EVENTS |
摘要 |
PURPOSE: An event time measuring circuit is provided to reduce noise while having a small size, thereby miniaturizing a semiconductor device. CONSTITUTION: An event time measuring circuit comprises a plurality of sub cells(300). The sub cell comprises first inverters(310), second inverters(312), and storing circuits(314). The first inverters are interconnected in series. The second inverters are interconnected in series. The storing circuits are connected to output ends of the first inverters. One or more second inverters are electrically connected to the corresponding first inverter. A first event signal is inputted in one among the first inverters. A second event signal is inputted in one among the second inverters. |
申请公布号 |
KR101123551(B1) |
申请公布日期 |
2012.03.12 |
申请号 |
KR20100089900 |
申请日期 |
2010.09.14 |
申请人 |
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
BAEG, SANG HYEON;LEE, SOON YOUNG |
分类号 |
G04F10/04;H03K5/14 |
主分类号 |
G04F10/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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