发明名称 METHOD FOR MANUFACTURING MOS TRANSISTOR
摘要 <p>PURPOSE: A method for manufacturing a MOS(Metal Oxide Semiconductor) transistor is provided to minimize gate line resistance by recessing a first work function metal layer to be below a top surface of a mold oxide layer. CONSTITUTION: Provided is a substrate(10) having a first active region(14) and a second active region(16). A dummy gate stack is formed on the first active region and the second active region. A spacer(30) is formed on a sidewall of the dummy gate stack. A source/drain region(34) is formed in the first active region. A mold dielectric film(40) is formed on the source/drain region.</p>
申请公布号 KR20120022252(A) 申请公布日期 2012.03.12
申请号 KR20100085650 申请日期 2010.09.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, HYE LAN;HYUN, SANG JIN;SHIN, YU GYUN;PARK, HONG BAE;LEE, HU YONG;HONG, HYUNG SEOK
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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