<p>PURPOSE: A method for manufacturing a MOS(Metal Oxide Semiconductor) transistor is provided to minimize gate line resistance by recessing a first work function metal layer to be below a top surface of a mold oxide layer. CONSTITUTION: Provided is a substrate(10) having a first active region(14) and a second active region(16). A dummy gate stack is formed on the first active region and the second active region. A spacer(30) is formed on a sidewall of the dummy gate stack. A source/drain region(34) is formed in the first active region. A mold dielectric film(40) is formed on the source/drain region.</p>
申请公布号
KR20120022252(A)
申请公布日期
2012.03.12
申请号
KR20100085650
申请日期
2010.09.01
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, HYE LAN;HYUN, SANG JIN;SHIN, YU GYUN;PARK, HONG BAE;LEE, HU YONG;HONG, HYUNG SEOK