发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A semiconductor device is provided to suppress light degradation by reducing an amount of light absorbed into an oxide semiconductor by increasing reflectivity of light in a wavelength range which is absorbed by the oxide semiconductor. CONSTITUTION: A gate electrode(401) is formed on a substrate(400). A source electrode is formed on the gate electrode. The source electrode is comprised of a gate insulating layer(402), an oxide semiconductor layer(409), a first conductive layer(406a), and a second conductive layer(405a). A drain electrode is formed on the source electrode. The drain electrode is comprised of the first conductive layer(406b) and the second conductive layer(405b).</p> |
申请公布号 |
KR20120022644(A) |
申请公布日期 |
2012.03.12 |
申请号 |
KR20110082634 |
申请日期 |
2011.08.19 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
GODO HIROMICHI;MURAYAMA KEISUKE |
分类号 |
H01L29/786;G02F1/136;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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