发明名称 METHOD FOR FORMING FINE PATTERNS AND METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE BY USING THE SAME
摘要 PURPOSE: A method for forming a minute pattern using a mask structure and a method for manufacturing a semiconductor device using the same are provided to form minute patterns with an aspect ratio of 6 : 1 to 16 : 1 by using a mask structure made of carbon materials. CONSTITUTION: A first sacrificial layer and first mask patterns(42) are successively formed on a bottom layer. Trenches are formed in the first sacrificial layer by patterning the first sacrificial layer using the first mask patterns as an etch mask. A second sacrificial layer fills the trenches. The sacrificial layer remains in the trenches by etching a second sacrificial layer to expose the first mask patterns. Second mask patterns(72) are formed on the first mask patterns cross the trenches. Second sacrificial patterns(64) are formed in the trenches by patterning the second sacrificial layer using the second mask patterns as the etch mask.
申请公布号 KR20120021722(A) 申请公布日期 2012.03.09
申请号 KR20100078474 申请日期 2010.08.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, NAM GUN;CHO, SUNG IL;KIM, YOON JAE
分类号 H01L21/027 主分类号 H01L21/027
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