发明名称 |
Preparation of material for examination by transmission electron microscopy techniques |
摘要 |
Method and apparatus for preparing a specimen for observation under the electron microscope by ion erosion. A saddle-field ion source is employed to irradiate the specimen with the specimen held in close proximity spacing with respect to the cathode aperture of the ion source. Such close proximity spacing ensures that the specimen is thinned at a rapid rate comparable with the rates attained with chemical etching.
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申请公布号 |
US4340815(A) |
申请公布日期 |
1982.07.20 |
申请号 |
US19800150745 |
申请日期 |
1980.05.19 |
申请人 |
ION TECH LIMITED |
发明人 |
FRANKS, JOSEPH |
分类号 |
G01N1/28;H01J37/304;H01J37/305;(IPC1-7):G01N23/00 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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