发明名称 BIN LEVEL DETECTION WITH LIGHT INTENSITY SENSING
摘要 An assembly has a bin level detection system having at least one sensor positioned to receive radiation reflected off any material deposited in a bin and to determine an intensity of the reflected radiation. The intensity corresponds to an amount or level of shredded material deposited in the bin. The system may detect radiation from one or more emitters, or, alternatively, detect ambient light entering the bin via a window. A level indicator system may also be provided to indicate the amount of material deposited in the bin, including if the bin is full. The assembly may comprise a shredder and a shredder housing.
申请公布号 US2012056026(A1) 申请公布日期 2012.03.08
申请号 US201113240498 申请日期 2011.09.22
申请人 MATLIN TAI HOON KIM;JENSEN MICHAEL D.;KRYNSKI JAKUB M.;FELLOWES, INC. 发明人 MATLIN TAI HOON KIM;JENSEN MICHAEL D.;KRYNSKI JAKUB M.
分类号 B02C23/00;G01N21/55 主分类号 B02C23/00
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