发明名称 METHOD FOR FILLING TRENCH AND FILM-DEPOSITION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for filling a trench, which can prevent a void from being formed in a filling material filled inside of the trench without forming a film inside of the trench, which serves as a barrier against oxidation. <P>SOLUTION: The method for filling the trench comprises the steps of: heating a semiconductor substrate 1 having an oxide film 7 formed at least on a side wall of a trench 6 and supplying an aminosilane-based gas to a surface of the semiconductor substrate 1 to form a seed layer 8 on the semiconductor substrate 1; heating the semiconductor substrate 1 having the seed layer 8 formed thereon and supplying a monosilane gas to a surface of the seed layer 8 to formed a silicon film 9 on the seed layer 8; filling the trench 6 of the semiconductor substrate 1 having the silicon film 9 formed thereon with a filling material 10 that is shrunk by being burned; and burning the filling material 10 for filling the trench 6 in an atmosphere containing water and/or a hydroxy group and also converting the silicon film 9 and the seed layer 8 into a silicon oxide. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012049509(A) 申请公布日期 2012.03.08
申请号 JP20110144733 申请日期 2011.06.29
申请人 TOKYO ELECTRON LTD 发明人 WATANABE MASAHISA;HASEBE KAZUHIDE
分类号 H01L21/76;C23C16/24;H01L21/205;H01L21/31;H01L21/316 主分类号 H01L21/76
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