发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND PATTERNING METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition which can achieve both excellent developability and excellent conformability to an immersion liquid, and a patterning method using the composition. <P>SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition contains a resin (B) which comprises at least one of a fluorine atom and a silicon atom and which contains a repeating unit represented by the following general formula (I-1) or (I-2). <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012048067(A) |
申请公布日期 |
2012.03.08 |
申请号 |
JP20100191373 |
申请日期 |
2010.08.27 |
申请人 |
FUJIFILM CORP |
发明人 |
IIZUKA YUSUKE;SHIBUYA AKINORI |
分类号 |
G03F7/004;C08F12/20;C08F20/22;C08F30/08;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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