发明名称 OXIDE SEMICONDUCTOR THIN FILM AND METHOD OF MANUFACTURING THE SAME, THIN FILM TRANSISTOR, AND DEVICE HAVING THIN FILM TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To obtain an oxide semiconductor thin film capable of improving the productivity and composition uniformity, causing no reduction in resistance in a low-temperature annealing, having a high reproducibility, and suitable for producing a large area device, in particular, a flexible device. <P>SOLUTION: In an oxide semiconductor thin film, In, Ga, and O are used as main constituent elements. A composition ratio of In and Ga is 3/4&le;Ga/(In+Ga)&le;9/10, and a resistivity is 1 &Omega;cm or more and 1&times;10<SP POS="POST">6</SP>&Omega;cm or less. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012049210(A) 申请公布日期 2012.03.08
申请号 JP20100187882 申请日期 2010.08.25
申请人 FUJIFILM CORP 发明人 TAKADA MASAHIRO;MOCHIZUKI FUMIHIKO;HAMA IFUMI
分类号 H01L29/786;G02F1/1368;H01L21/324;H01L21/336;H01L27/14;H01L27/146;H01L31/09 主分类号 H01L29/786
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