发明名称 |
WAFER TRAY, SEMICONDUCTOR WAFER TESTING APPARATUS, AND SEMICONDUCTOR WAFER TESTING METHOD |
摘要 |
<p>A wafer tray (60) that holds a semiconductor wafer (100) is provided with: a wafer placing plate (61), on which the semiconductor wafer (100) is to be placed; a tray main body section (62), which supports the wafer placing plate (61) such that the wafer placing plate can slightly move; and a vibration actuator (64), which applies vibration to the wafer placing plate (61).</p> |
申请公布号 |
WO2012029130(A1) |
申请公布日期 |
2012.03.08 |
申请号 |
WO2010JP64830 |
申请日期 |
2010.08.31 |
申请人 |
ADVANTEST CORPORATION;MATSUMURA, SHIGERU |
发明人 |
MATSUMURA, SHIGERU |
分类号 |
H01L21/66;H01L21/683 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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