发明名称 WAFER TRAY, SEMICONDUCTOR WAFER TESTING APPARATUS, AND SEMICONDUCTOR WAFER TESTING METHOD
摘要 <p>A wafer tray (60) that holds a semiconductor wafer (100) is provided with: a wafer placing plate (61), on which the semiconductor wafer (100) is to be placed; a tray main body section (62), which supports the wafer placing plate (61) such that the wafer placing plate can slightly move; and a vibration actuator (64), which applies vibration to the wafer placing plate (61).</p>
申请公布号 WO2012029130(A1) 申请公布日期 2012.03.08
申请号 WO2010JP64830 申请日期 2010.08.31
申请人 ADVANTEST CORPORATION;MATSUMURA, SHIGERU 发明人 MATSUMURA, SHIGERU
分类号 H01L21/66;H01L21/683 主分类号 H01L21/66
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