| 摘要 |
The invention relates to a microscope and method for detecting sample light, having at least one illuminating beam which is partially phase-modulated with a modulation frequency along the cross-section thereof and a microscope objective for intensity-modulated focusing of the illuminating beam into a sample and also having a detection beam path having at least one demodulator. Advantageously at least one electro-optic modulator (EOM) is used for phase modulation of at least a part, preferably half of the illuminating beam, or different portions or halves of the illuminating beam are modulated differently, preferably anti-phase, by anti-phase control of piezoelectric elements, or acousto-optic modulators are provided for subdivision into a plurality of partial beam paths and optic elements are provided for partial phase modulation of the excitation beam. Also actuating elements are advantageously provided for setting the phase difference or at least one optic modulator, preferably an acousto-optic modulator (AOM), is used for demodulation in the detection or a change to the mode of operation of the detectors for demodulation takes place or in the case of foci distribution, produced for example by a rotating micro-lens disc or multisport generation the individual foci are subjected to an intensity modulation, either by arranging a half-space phase mask in a pupil plane of the objective or by individually manipulating each partial beam by means of the partial phase modulation of said partial beam with a modulation frequency along the cross-section thereof or by manipulating a beam by means of the partial phase modulation of said beam with a modulation frequency along the cross-section thereof and subsequent subdivision of said beam. |
