| 摘要 |
An interferometer type deflection measuring device having a radiation source, a first fiber-optic means forming a first light path, a second fiber-optic means forming a second light path, a deflection body and an evaluation circuit, the first and second fiber-optic means receiving radiation from the radiation source on an input side, and radiation guided in the first and second fiber-optic means, respectively, being brought together on an output side with interference radiation being conveyed to the evaluation circuit for evaluation. The first fiber-optic means and the second fiber-optic means are arranged only on the deflection body, at least one of the first and second fiber-optic means being connected on the input side to the beam source with a single feed optical fiber and at least one of the first and second fiber-optic means being connected on the output side to the evaluation circuit by a single evaluation optical fiber. |
