发明名称 BARRIER STRUCTURES AND METHODS OF FORMING SAME TO FACILITATE SILICON CARBIDE EPITAXY AND SILICON CARBIDE-BASED MEMORY FABRICATION
摘要 Embodiments of the invention relate generally to semiconductors and semiconductor fabrication techniques, and more particularly, to devices, integrated circuits, substrates, wafers and methods to form barrier structures to facilitate formation of silicon carbide epitaxy on a substrate, such as a silicon-based substrate, for fabricating various silicon carbide-based semiconductor devices, including silicon carbide-based memory elements and cells. In some embodiments, a semiconductor wafer includes a silicon substrate, a barrier-seed layer disposed over the silicon substrate, and a silicon carbide layer formed over the barrier-seed layer. The semiconductor wafer can be used to form a variety of SiC-based semiconductor devices. In one embodiment, a silicon carbide-based memory element is formed to include barrier-seed layer, multiple silicon carbide layers formed over the barrier-seed layer, and a dielectric layer formed over the multiple silicon carbide layers.
申请公布号 US2012056194(A1) 申请公布日期 2012.03.08
申请号 US20100876028 申请日期 2010.09.03
申请人 DIMITRIJEV SIMA;WANG LI;HAN JISHENG;IACOPI ALAN;HOLD LEONIE;TANNER PHILIP;KONG FRED;HARRISON HERBERT BARRY;QS SEMICONDUCTOR AUSTRALIA PTY LTD 发明人 DIMITRIJEV SIMA;WANG LI;HAN JISHENG;IACOPI ALAN;HOLD LEONIE;TANNER PHILIP;KONG FRED;HARRISON HERBERT BARRY
分类号 H01L29/24;H01L21/20 主分类号 H01L29/24
代理机构 代理人
主权项
地址