发明名称 APPARATUS GENERATING TEST SIGNALS FOR ELECTRONIC EQUIPMENT
摘要 A generating device comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples to analog signals at the output of the device. A read/write memory is interposed between the digital-to-analog converter and the storage means. A computer is coupled to the storage means and to the read/write memory. The computer comprises means for generating test signals in the form of digital samples, means whereby the samples stored within the storage means and the test signals produced by the generating means are transferred into the read/write memory as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
申请公布号 DE3361524(D1) 申请公布日期 1986.01.30
申请号 DE19833361524 申请日期 1983.03.11
申请人 THOMSON-CSF 发明人 PHAM VAN CANG, LUC
分类号 H04N17/00;H04B17/00;H04N17/02;(IPC1-7):H04N17/00 主分类号 H04N17/00
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