发明名称 METHOD FOR MANUFACTURING BONDED WAFER
摘要 Disclosed is a method for performing peeling without generating breakage of a substrate in the case where the thermal expansion coefficient of a handle substrate is higher than that of a donor substrate. A method for manufacturing a bonded wafer at least includes: a step of forming an ion-implanted interface (5) by implanting ions from the surface of a donor substrate (3); a step of making a bonded substrate by bonding a handle substrate (7), which has a thermal expansion coefficient higher than that of the donor substrate (3), on the donor substrate (3) surface having the ions implanted therein; a step of obtaining a bonded body (1) by performing heat treatment to the bonded substrate; a peeling step wherein the bonded body (1) is cooled to a temperature below the room temperature by means of a cooling apparatus (20), the donor substrate (3) of the bonded body (1) is peeled from the ion-implanted interface, and a donor thin film is transferred onto the handle substrate (7).
申请公布号 EP2426697(A1) 申请公布日期 2012.03.07
申请号 EP20100769820 申请日期 2010.04.30
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 KAWAI, MAKOTO;TOBISAKA, YUJI;AKIYAMA, SHOJI
分类号 H01L21/02;H01L21/265;H01L21/762;H01L27/12 主分类号 H01L21/02
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