发明名称 |
METHOD FOR MANUFACTURING BONDED WAFER |
摘要 |
Disclosed is a method for performing peeling without generating breakage of a substrate in the case where the thermal expansion coefficient of a handle substrate is higher than that of a donor substrate. A method for manufacturing a bonded wafer at least includes: a step of forming an ion-implanted interface (5) by implanting ions from the surface of a donor substrate (3); a step of making a bonded substrate by bonding a handle substrate (7), which has a thermal expansion coefficient higher than that of the donor substrate (3), on the donor substrate (3) surface having the ions implanted therein; a step of obtaining a bonded body (1) by performing heat treatment to the bonded substrate; a peeling step wherein the bonded body (1) is cooled to a temperature below the room temperature by means of a cooling apparatus (20), the donor substrate (3) of the bonded body (1) is peeled from the ion-implanted interface, and a donor thin film is transferred onto the handle substrate (7). |
申请公布号 |
EP2426697(A1) |
申请公布日期 |
2012.03.07 |
申请号 |
EP20100769820 |
申请日期 |
2010.04.30 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
KAWAI, MAKOTO;TOBISAKA, YUJI;AKIYAMA, SHOJI |
分类号 |
H01L21/02;H01L21/265;H01L21/762;H01L27/12 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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