发明名称 Deflection measuring device using the interferometry principle
摘要 <p>The device has fiber-optic units (3, 4) subjected with interference radiation of a radiation source (2) and connected with a deflection body (5). Partial radiations guided into the fiber-optic units are united together at an output side. The radiations are guided to an evaluation circuit (6) for evaluating the radiations. The fiber-optic units are connected with the radiation source using an optical feed fiber (9), and with the evaluation circuit using an optical evaluation fiber (10) at an output side. The feed fiber and/or the evaluation fiber are formed by an optical single core fiber.</p>
申请公布号 EP2426466(A1) 申请公布日期 2012.03.07
申请号 EP20110006953 申请日期 2011.08.25
申请人 KROHNE MESSTECHNIK GMBH 发明人 KRISCH, HENRIK
分类号 G01F1/32;G01B11/16;G01D5/353;G02B6/02;G02B6/293 主分类号 G01F1/32
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