发明名称 Manufacturing method of microstructure
摘要 A manufacturing method of a microstructure which enables production of a deep and narrow microstructure in a GaN semiconductor with high precision is provided. The manufacturing method of a microstructure for forming a microscopic structure in a semiconductor has a configuration having a first step of forming a first GaN semiconductor layer on a substrate, a second step of forming a first hole by using etching on the first GaN semiconductor layer formed in the first narrow, and a third step of performing heat-treatment at a temperature from 850° C. to 950° C. inclusive under a gas atmosphere including nitrogen, in order to form a second narrow in which a diameter of the first hole h formed in the second step is made narrower than the diameter of the first hole in an in-plane direction of the substrate.
申请公布号 US8129210(B2) 申请公布日期 2012.03.06
申请号 US20100914939 申请日期 2010.10.28
申请人 KAWASHIMA TAKESHI;HOSHINO KATSUYUKI;KAWASHIMA SHOICHI;NAGATOMO YASUHIRO;CANON KABUSHIKI KAISHA 发明人 KAWASHIMA TAKESHI;HOSHINO KATSUYUKI;KAWASHIMA SHOICHI;NAGATOMO YASUHIRO
分类号 H01L21/00 主分类号 H01L21/00
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