| 摘要 |
It is possible to provide a semiconductor test program debug device capable of reducing the unnecessary facilities when using a semiconductor test device or a semiconductor test program of different specification. The semiconductor test program debug device 300 includes a virtual device 80 for simulating operation of the device under test, a dedicated test bench processing section 60 and a general-purpose test bench processing section 70 for generating a pseudo test signal and a response signal inputted/outputted between to/from the virtual device 80, conversion source program storage sections 10-14 for storing a plurality of semiconductor test programs of different specifications, dedicated conversion rule storage sections 30, 32 and general-purpose conversion rule storage sections 40, 42 for storing conversion rules corresponding to the respective specifications, and conversion processing sections 20-26 for generating the dedicated and the general-purpose bench processing sections 60, 70 by using the semiconductor test programs stored in the conversion source program storage sections 10-14. |
