发明名称 |
SYSTEM AND METHOD FOR EXECUTING FUNCTIONAL SCANNING IN AN INTEGRATED CIRCUIT ENVIRONMENT |
摘要 |
An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing a functional scan mode in order to reproduce the failure associated with the integrated circuit. A functional state of the integrated circuit is locked when the failure occurs, and the functional state is subsequently recovered for a structure test for the integrated circuit. In more particular embodiments, particular states of the functional test are evaluated and compared against other states associated with a model circuit that did not experience any failure in order to identify a latest cycle of the integrated circuit that could trigger the failure and an earliest cycle of the integrated circuit that could observe the failure. |
申请公布号 |
US2012053924(A1) |
申请公布日期 |
2012.03.01 |
申请号 |
US20100873135 |
申请日期 |
2010.08.31 |
申请人 |
WANG ZHIYUAN;GU XINLI;WANG ZHANGLEI;FANG HONGXIA;CISCO TECHNOLOGY, INC. |
发明人 |
WANG ZHIYUAN;GU XINLI;WANG ZHANGLEI;FANG HONGXIA |
分类号 |
G01R31/00;G06F19/00;G06G7/62 |
主分类号 |
G01R31/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|