发明名称 IMAGING ELEMENT AND IMAGING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an imaging element in which a phase difference characteristic is equalized. <P>SOLUTION: A microlens 350 collects an object light. A light receiving element 370 generates a signal for performing focus determination by phase difference detection by receiving the object light collected by the microlens 350. A light-shielding layer 362 is provided between the microlens 350 and the light receiving element 370 and shields one portion of the object light collected by the microlens 350. In the imaging element, a distance between the light-shielding layer 362 and the microlens 350 in an optical axis direction of the microlens 350 is set to shorten depending on the increase of the image height. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012043939(A) 申请公布日期 2012.03.01
申请号 JP20100183149 申请日期 2010.08.18
申请人 SONY CORP 发明人 SHIMODA KAZUTO;FUJII SHINICHI
分类号 H01L27/14;H01L27/146;H04N5/232 主分类号 H01L27/14
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