发明名称 SYSTEM AND METHOD FOR TESTING PERIPHERAL COMPONENT INTERCONNECT EXPRESS SWITCH
摘要 A method tests peripheral component interconnect express (PCI-E) switches. A second PCI-E switch to be tested electronically connects to a first PCI-E switch of a computing device. A first data packet is created by the computing device and sent from the first PCI-E switch to the second PCI-E switch. A second data packet sent back by the second PCI-E switch is received by the computing device. The second PCI-E switch works normally if the first data packet is identical to the second data packet. The second PCI-E switch does not work normally if the first data packet is not identical to the second data packet.
申请公布号 US2012054557(A1) 申请公布日期 2012.03.01
申请号 US201113159365 申请日期 2011.06.13
申请人 FAN CHAO-TSUNG;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 FAN CHAO-TSUNG
分类号 G06F11/26 主分类号 G06F11/26
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