发明名称 |
SYSTEM AND METHOD FOR TESTING PERIPHERAL COMPONENT INTERCONNECT EXPRESS SWITCH |
摘要 |
A method tests peripheral component interconnect express (PCI-E) switches. A second PCI-E switch to be tested electronically connects to a first PCI-E switch of a computing device. A first data packet is created by the computing device and sent from the first PCI-E switch to the second PCI-E switch. A second data packet sent back by the second PCI-E switch is received by the computing device. The second PCI-E switch works normally if the first data packet is identical to the second data packet. The second PCI-E switch does not work normally if the first data packet is not identical to the second data packet.
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申请公布号 |
US2012054557(A1) |
申请公布日期 |
2012.03.01 |
申请号 |
US201113159365 |
申请日期 |
2011.06.13 |
申请人 |
FAN CHAO-TSUNG;HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
FAN CHAO-TSUNG |
分类号 |
G06F11/26 |
主分类号 |
G06F11/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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