发明名称 METHOD AND SYSTEM FOR LITHOGRAPHY PROCESS WINDOW SIMULATION
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of simulating imaging performance of a lithographic process utilized to image a target design having a plurality of features. <P>SOLUTION: The method includes the steps of: determining a function for generating a simulated image, where the function accounts for process variations associated with the lithographic process; and generating the simulated image utilizing the function, where the simulated image represents an imaging result of the target design for the lithographic process. In one given embodiment, the function for simulating spatial images with focus and dose (exposure) variations is defined as the following equation, where I<SB POS="POST">0</SB>represents image intensity at nominal focus and exposure, f<SB POS="POST">0</SB>represents nominal focus, f and &epsi; represent actual focus-exposure levels at which the simulated image is calculated, and parameters "a" and "b" represent first order and second order derivative images with respect to focus change. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012044222(A) 申请公布日期 2012.03.01
申请号 JP20110257068 申请日期 2011.11.25
申请人 ASML NETHERLANDS BV 发明人 YE JUN;CAO YU;FEN HANNING
分类号 H01L21/027 主分类号 H01L21/027
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