发明名称 |
EXAMINATION MEASUREMENT INSTRUMENT AND TRIGGER METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a flexible examination measurement instrument and method whereby trigger can be generated for frequency and phase information. <P>SOLUTION: An examined radio frequency signal is received with an input terminal 110 of the examination measurement instrument 100, and the radio frequency signal is digitalized with an analog digital converter 108. A down-converter 115 generates I (in-phase) and Q (orthogonal phase) base band component information from the digitalized radio frequency signal. A power detector 145 obtains a power level by using the I and Q base band component information. A demodulator 145 generates a time domain trace for the I and Q bases when the power level obtained by the power detector exceeds a predetermined threshold value. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012042462(A) |
申请公布日期 |
2012.03.01 |
申请号 |
JP20110169419 |
申请日期 |
2011.08.02 |
申请人 |
TEKTRONIX INC |
发明人 |
ALFRED K HILLMAN JR;DASILVA MARCUS K;KATHRYN A ENGHOLM;KENNETH P DOBBINS |
分类号 |
G01R23/16;G01R13/20;G01R23/173 |
主分类号 |
G01R23/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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