| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a correction method of measurement data which eliminates an influence of variation of electric field enhancement derived from variation of thickness of a metal thin film constituting an SPFS sensor substrate, and thus, enhances measurement accuracy and reliability of SPFS, etc., without introducing complicated configurations to the SPFS sensor substrate and an assay method using the same. <P>SOLUTION: The present invention provides the correction method of a fluorescent signal for calculating electric field enhancement ratio R from signals (Sp) and (Sq) to be measured in an area (P) where a fluorescent molecule layer is formed without interposing the metal thin film and in an area (Q) where the fluorescent molecule layer is formed via the metal thin film for the fluorescent signal (Sm), and converting the fluorescent signal into the corrected signal (Sm1) using the electric field enhancement ratio R, and the assay method using the method. <P>COPYRIGHT: (C)2012,JPO&INPIT |
