| 摘要 |
This invention has an object of providing a semiconductor integrated circuit enabling further reduction of the number of test terminals without depending on a compression/expansion technique alone. The semiconductor integrated circuit of the invention is connected to a terminal group used to exchange test information of a circuit to be tested, and comprises a utilization device which utilizes, when reading a test result, a terminal subgroup of the terminal group, which is not used to transmit information required to read the test result, to receive the test result from the circuit to be tested.
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