发明名称 PROCESS KIT SHIELD FOR IMPROVED PARTICLE REDUCTION
摘要 Apparatus for improved particle reduction are provided herein. In some embodiments, an apparatus may include a process kit shield comprising a one-piece metal body having an upper portion and a lower portion and having an opening disposed through the one-piece metal body, wherein the upper portion includes an opening-facing surface configured to be disposed about and spaced apart from a target of a physical vapor deposition chamber and wherein the opening-facing surface is configured to limit particle deposition on an upper surface of the upper portion of the one-piece metal body during sputtering of a target material from the target of the physical vapor deposition chamber.
申请公布号 WO2011143527(A3) 申请公布日期 2012.03.01
申请号 WO2011US36395 申请日期 2011.05.13
申请人 APPLIED MATERIALS, INC.;RASHEED, MUHAMMAD;WANG, RONGJUN;LIU, ZHENDONG;FU, XINYU;TANG, XIANMIN 发明人 RASHEED, MUHAMMAD;WANG, RONGJUN;LIU, ZHENDONG;FU, XINYU;TANG, XIANMIN
分类号 C23C14/34;C23C14/06 主分类号 C23C14/34
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