| 发明名称 |
Constructing Mapping Between Model Parameters and Electrical Parameters |
| 摘要 |
A method includes determining a mapping between model parameters and electrical parameters of integrated circuits. The model parameters are configured to be used by a simulation tool. A set of electrical parameters is provided, and the mapping is used to map the set of electrical parameters to a set of model parameters. |
| 申请公布号 |
US2012054709(A1) |
申请公布日期 |
2012.03.01 |
| 申请号 |
US20100871683 |
申请日期 |
2010.08.30 |
| 申请人 |
TSAI CHEN-MING;SU KE-WEI;HSIAO CHENG;JENG MIN-CHIE;LO JIA-LIN;HSIAO FENG-LING;HUANG YI-SHUN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
TSAI CHEN-MING;SU KE-WEI;HSIAO CHENG;JENG MIN-CHIE;LO JIA-LIN;HSIAO FENG-LING;HUANG YI-SHUN |
| 分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
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