发明名称 DRIVE METHOD FOR MEMORY ELEMENT AND STORAGE DEVICE USING MEMORY ELEMENT
摘要 <p>In order to carry out switching operations with greater stability this drive method for a memory element (10) is characterised by applying current pulses to the memory element, by means of a constant current circuit, when switching from a high resistance state to a low resistance state. The memory element (10) is provided with: an insulating substrate (1); a first electrode (2) and a second electrode (3), which are provided on the insulating substrate; and an inter-electrode gap unit (4) which is provided between the first electrode and the second electrode, and which has nanometre-order gaps wherein a change in the resistance between the first and the second electrodes occurs. The memory element is capable of switching from a prescribed low resistance state to a prescribed high resistance state, and from a high resistance state to a low resistance state.</p>
申请公布号 WO2012026507(A1) 申请公布日期 2012.03.01
申请号 WO2011JP69117 申请日期 2011.08.25
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY;FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC.;FUNAI ELECTRIC CO., LTD.;TAKAHASHI, TSUYOSHI;MASUDA, YUICHIRO;FURUTA, SHIGEO;SUMIYA, TOURU;ONO, MASATOSHI;HAYASHI, YUTAKA;FUKUOKA, TOSHIMI;SHIMIZU, TETSUO;SOMU, KUMARAGURUBARAN;SUGA, HIROSHI;NAITOU, YASUHISA 发明人 TAKAHASHI, TSUYOSHI;MASUDA, YUICHIRO;FURUTA, SHIGEO;SUMIYA, TOURU;ONO, MASATOSHI;HAYASHI, YUTAKA;FUKUOKA, TOSHIMI;SHIMIZU, TETSUO;SOMU, KUMARAGURUBARAN;SUGA, HIROSHI;NAITOU, YASUHISA
分类号 G11C13/00;H01L27/10;H01L27/105;H01L45/00;H01L49/00 主分类号 G11C13/00
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