DEVICE HAVING A MULTILAYERED STRUCTURE

摘要

PURPOSE: A multilayered structure device is provided to measure a coverage ratio of LiF on Alq3 by measuring a crystallization of Al in an OLED device. CONSTITUTION: A multilayered structure device includes a substrate(100), a first layer, a second layer, and a third layer. The first layer is formed on the substrate. The second layer is formed on the first layer. The third layer is formed on the second layer. The second layer formed on the first layer has a coverage ratio according to the crystallization of the third layer.