发明名称 PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE
摘要 A phase change memory element and method of forming the same. The memory element includes first and second electrodes. A first layer of phase change material is between the first and second electrodes. A second layer including a metal-chalcogenide material is also between the first and second electrodes and is one of a phase change material and a conductive material. An insulating layer is between the first and second layers. There is at least one opening in the insulating layer providing contact between the first and second layers.
申请公布号 EP1969649(B1) 申请公布日期 2012.02.29
申请号 EP20060845194 申请日期 2006.12.12
申请人 MICRON TECHNOLOGY, INC. 发明人 DALEY, JON;CAMPBELL, KRISTY, A.
分类号 H01L45/00 主分类号 H01L45/00
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