Semiconductor memory for storing several bits at same address - has comparator circuits for determining concordance of data from cell blocks and data at terminal

摘要

The semiconductor memory (30) reduces the testing time in addition to storing numerous bits at the same address. It has comparison circuits between a number of memory cell blocks (42a-d). From the latter, data are read-out at the same address. It uses an input/output terminal (62) for data read-out and writing in normal operation. The comparison circuits pick-up coincidence, or non-coincidence of the data from the memory cell blocks and the terminal. Pref. a logic (60) overrides the outputs of the comparison circuits. It transmits a fault indicator signal via a non-coupled output (64). ADVANTAGE - For simple semiconductor memory testing, with reduced testing time, and fewer terminal connections.