发明名称 |
Control method for semiconductor integrated circuit and semiconductor integrated circuit |
摘要 |
A semiconductor integrated circuit includes a self-test circuit, wherein, when a operation mode of the self-test circuit has been switched from a low-speed operation mode to a high-speed operation mode, processing is performed in the high-speed operation mode during a given time period, and the processing result is invalidated based on a control signal. |
申请公布号 |
US8127191(B2) |
申请公布日期 |
2012.02.28 |
申请号 |
US20090643874 |
申请日期 |
2009.12.21 |
申请人 |
MAKI TAKASHI;TSUKUDA DAISUKE;HIRAMATSU TETSUYA;FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
MAKI TAKASHI;TSUKUDA DAISUKE;HIRAMATSU TETSUYA |
分类号 |
G01R31/28;G01R27/28;G01R31/00;G01R31/14;G01R31/3187;G11C7/00;G11C7/02;G11C29/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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