发明名称 Oxidation method providing parallel gas flow over substrates in a semiconductor process
摘要 An oxidation method includes supplying oxidizing and deoxidizing gases to a process field by spouting the gases in lateral directions respectively from first and second groups of gas spouting holes. Each group of holes is disposed adjacent to target substrates on one side of the process field and arrayed over a length corresponding to the process field in a vertical direction. Gases are exhausted through an exhaust port disposed opposite to the first and second groups of gas spouting holes with the process field interposed therebetween and present over a length corresponding to the process field in the vertical direction. This causes the gases to flow along the surfaces of the target substrates, thus forming gas flows parallel with the target substrates. The process field is heated by a heater disposed around the process container to generate oxygen radicals and hydroxyl group radicals within the process field.
申请公布号 US8124181(B2) 申请公布日期 2012.02.28
申请号 US20070907968 申请日期 2007.10.18
申请人 HASEBE KAZUHIDE;FUJITA TAKEHIKO;NAKAJIMA SHIGERU;OGAWA JUN;TOKYO ELECTRON LIMITED 发明人 HASEBE KAZUHIDE;FUJITA TAKEHIKO;NAKAJIMA SHIGERU;OGAWA JUN
分类号 C23C16/40 主分类号 C23C16/40
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