发明名称 Exposure apparatus, exposure method, and device manufacturing method
摘要 An exposure apparatus includes a projection optical system, which projects a pattern of a mask onto a prescribed exposure area on a substrate at a prescribed projection magnification. The optical axis center of the projection optical system is set to a position different from that of the center of the projection area onto which the pattern is projected. The exposure apparatus further includes a magnification modification device, which modifies the projection magnification of the projection optical system; a calculation device, which calculates a shift length of the center of the projection area associated with modification of the projection magnification; and a correction device, which corrects the position information of the exposure area based on the shift length of the center of the projection area.
申请公布号 US8125613(B2) 申请公布日期 2012.02.28
申请号 US20070785715 申请日期 2007.04.19
申请人 SUZUKI KOUSUKE;NIKON CORPORATION 发明人 SUZUKI KOUSUKE
分类号 G03B27/32;G01B11/00;G03B27/42;G03B27/52;G03B27/58;G03B27/62 主分类号 G03B27/32
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