发明名称 Scanning electron microscope
摘要 It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts a sample image lm(t2) obtained by retroceding from a sample image lm(te) stored so as to be associated with time te of error occurrence by a predetermined video quantity (for example, total recording time period t2) previously set and registered by an input-output device, from sample images stored in a recording device while being overwritten, and stores a resultant sample image in another recording device.
申请公布号 US8124934(B2) 申请公布日期 2012.02.28
申请号 US20080264605 申请日期 2008.11.04
申请人 MAEDA TATSUYA;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MAEDA TATSUYA
分类号 G01N23/00 主分类号 G01N23/00
代理机构 代理人
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