| 摘要 |
PURPOSE: A dimple inspection apparatus and method are provided to precisely inspect even deep dimples using the brightness saturation and roughness degrees of the pixels of a hole on a binarized image. CONSTITUTION: A dimple inspection apparatus(10) comprises a lighting unit(13), a photographing unit(15), an image processing unit(17), and a control unit(19). The lighting unit irradiates light on an object(11). The photographing unit takes a picture of the light which is irradiated from the lighting unit and reflected off the object. The image processing unit obtains a binarized image by converting the photographed light into an image. The control unit executes first pass/fail judgment using the brightness saturation of the pixels in a first area of a hole on the binarized image. If a failure exists, the control executes second pass/fail judgment using the brightness saturation of the adjacent pixels in a second area of the hole.
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