发明名称 Memory device having trapezoidal bitlines and method of fabricating same
摘要 A memory device and a method of fabrication are provided. The memory device includes a semiconductor substrate and a charge trapping dielectric stack disposed over the semiconductor substrate. A gate electrode is disposed over the charge trapping dielectric stack, where the gate electrode electrically defines a channel within a portion of the semiconductor substrate. The memory device includes a pair of bitlines, where the bitlines have a lower portion and a substantially trapezoidal shaped upper portion.
申请公布号 US8125018(B2) 申请公布日期 2012.02.28
申请号 US20050033588 申请日期 2005.01.12
申请人 MELIK-MARTIROSIAN ASHOT;RAMSBEY MARK T.;RANDOLPH MARK W.;SPANSION LLC 发明人 MELIK-MARTIROSIAN ASHOT;RAMSBEY MARK T.;RANDOLPH MARK W.
分类号 H01L29/792 主分类号 H01L29/792
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