| 摘要 |
PURPOSE: A method for determining a data valid window in a system and method for testing an integrated circuit device is provided to determine a data valid window property for identifying a component of a response data signal from a device. CONSTITUTION: A tester(10) includes a program memory(12), a controller(14), a microprocessor(16), a TVPG(Text Vector Pattern Generator)(18), and a comparator block(19). The microprocessor searches a command from the program memory and commands the TVGP to generate a digital expression of a test vector pattern in response to the command. The TVPG transmits the command to the controller. The controller communicates with a DUT(Device Under Test)(20) through a communication channel(6). The controller receives the test vector pattern, converts the test vector pattern into an electric waveform, and outputs the electric waveform to the DUT through a communication channel. |
