发明名称 APPARATUS AND METHOD FOR PROCESSING SUBSTRATE
摘要 PURPOSE: An apparatus and a method for processing a substrate are provided to improve a processing efficiency by reducing a time requiring for processing a substrate by processing a target area in a detected substrate. CONSTITUTION: An align unit(20) aligns a substrate to determine the position thereof. The align unit comprises a plurality of support members supporting the both sides of the substrate and also includes a transport unit. The transport unit transfers the support members to be close to each other or separated from each other. A support member(211) pressing the both sides of the substrate is formed in the support member. A detecting unit(30) detects the location of a target region of the substrate. A processing unit processes the target region which is detected by the detection unit.
申请公布号 KR20120016931(A) 申请公布日期 2012.02.27
申请号 KR20100079469 申请日期 2010.08.17
申请人 QMC. INC. 发明人 RYU, BENG SO;JUNG, HONG JIN;LEE, BYONG SHIK;KIM, BUM JOONG;JANG, HYEON SAM;KIM, HARK YONG;KWAK, JONG HO;KIM, YOUNG YONG;HONG, SUN YOUNG
分类号 H01L21/68 主分类号 H01L21/68
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